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Magazine Name : Ieee Transactions On Reliability

Year : 2002 Volume number : 51 Issue: 03

Analysis Of Incorporating Logistic Testing-Effort Function Into Software Reliability Modeling (Article)
Subject: Nonhomogeneous Poisson Process , Software Reliability Growth Model , Mean Value Function , Optimal Software Release Policy
Author: Chin-Yu Huang      Sy-Yen Kuo     
page:      261 - 270
Performance Of Parameter-Estimates In Step-Stress Accelerated Life-Tests With Various Sample-Sizes (Article)
Subject: Confidence Intervals , Cumulative Exposure Model , Maximum Likelihood Estimation , Accelerated Life Test
Author: Jye-Chyi Lu      Ellen Overton Mcsorley      Chin-Shang Li     
page:      271 - 277
Treatment Of General Dependencies In System Fault-Tree And Risk Analysis (Article)
Subject: Common-Cause Failures , Fault Trees , Implicit Method , Explicit Method
Author: Jussi K Vaurio     
page:      278 - 287
Environmental-Stress-Screening Using Degradation Measurements (Article)
Subject: Critical Value , Degradation , Environmental Stress , Life-Cycle-Cost
Author: Guangbin Yang     
page:      288 - 293
Reliability Databases In Perspective (Article)
Subject: Censoring , Competing Risk , Colored Poisson Process , Dependent Competing Risk
Author: Roger Cooke      T. Bedford     
page:      294 - 310
A Software-Reliability Growth Model For N-Version Programming Systems (Article)
Subject: Non-Homogeneous Poisson Process , N-Version Program , Software Fault Tolerance , Software Reliability Growth Model
Author: Hoang Pham      Xiaolin Teng     
page:      311 - 321
Cost-Optimal Condition-Monitoring For Predictive Maintenance Of 2-Phase Systems (Article)
Subject: Condition Monitoring , Maintenance Cost Optimization , Operating Characteristics , Predictive Maintenance
Author: Stephen M. Pollock      Lisa M. Maillart     
page:      322 - 330
Reliability Tests For Weibull Distribution With Varying Shape-Parameter, Based On Complete Data (Article)
Subject: Mean Time To Failure , Reliability Testing , Weibull Distribution , Approximation Of Wilson-Hilferty
Author: Ikuo Arizino      Koji Hisada     
page:      331 - 336
Reliability Estimation In A Generalized Life-Model With Application To The Burr-Xii (Article)
Subject: Bayes Prediction , Burr-Xii Model , Lifetime Distributions , Lindley Procedure
Author: Ahmed A. Soliman     
page:      337 - 343
Choosing A Heuristic For The "Fault Tree To Binary Decision Diagram" Conversion, Using Neural Networks (Article)
Subject: Binary Decision Diagram , Fault-Tree Analysis , Neural Networks , Variable Ordering Heuristics
Author: L.M. Bartlett      John D. Andrews     
page:      344 - 349
Improved Disk-Drive Failure Warnings (Article)
Subject: Disk Drive , Failure Prediction , Magnetic Recording , Predictive Failure Analysis
Author: K Kreutz-Delgado      Joseph F. Murray      Gordon F. Hughes     
page:      350 - 357
Grobner Bases, Abstract Tubes, And Inclusion-Exclusion Reliability Bounds (Article)
Subject: Grobner Bases , Reliability Theory , Abstract Tubes
Author: Henry P. Wynn      Daniel Q. Naiman      Beatrice Giglio     
page:      358 - 366
Elimination Of Bipolar Induced Drain Breakdown And Single Transistor Latch In Submicron Pd Soi Mosfet (Article)
Subject: Floating Body Effects , Soi Mosfet , Cmos Reliability , Drain Breakdown
Author: M Jagadesh Kumar      Vikram Verma     
page:      367 - 370
The Availability Of Inspected Systems Subject To Shocks And Graceful Degradation (Article)
Subject: Limiting Average-Availability , Graceful Degradation , Non Self-Announcing Failures , Regenerative Process
Author: Georgia-Ann Klutke      Yoonjung Yang     
page:      371 - 374
Addendum To: Generic Rules To Evaluate System-Failure Frequency (Article)
Subject: System Availability , Time-Specific , Generic Reuse Model , Time-Specific System Failure-Frequency
Author: Suprasad V. Amari     
page:      378 - 379